Field return analysis is necessary to understand the root cause of a product failure, in order to adjust production, process quality or provide special solutions due to critical service environments or improper packaging materials containing dangerous substances.

We can characterize any type of contamination by organic or inorganic compounds such as flux residual or Chlorine/Sulphur salts via FT- IR Spectroscopy or EDX Spectrometer analyses.

Materials structural aspect can be finely detailed by Scanning Electron Microscope up to 100.000X magnification.

  • Scanning Electron Microscope: morphologic analysis at high magnification
  • Energy Dispersive X-Ray Spectroscopy: chemical analysis of inorganic compounds
  • FT-IR Spectroscopy: chemical analysis of organic compounds

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Are you experiencing a thick film SMD resistor open or short condition?

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